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Recent Findings from Samsung Advanced Institute of Technology Provides New Insights into Engineering (Electric Field-assisted Patterning of Few-layer Mote2 By Scanning Probe Lithography)

Press/Media

Period2023.01.9

Media coverage

1

Media coverage

  • TitleRecent Findings from Samsung Advanced Institute of Technology Provides New Insights into Engineering (Electric Field-assisted Patterning of Few-layer Mote2 By Scanning Probe Lithography)
    Media name/outletSouth Korea Daily Report
    Country/TerritoryUnited States
    Date23.01.9
    PersonsSeong Heon Kim