Studies from Seoul National University Yield New Information about Data Retention (Vertical-nand Flash Memory With an Intercell Charge Trap Layer for the Improvement of Erase Efficiency and Data Retention)

Media coverage

• Title	Studies from Seoul National University Yield New Information about Data Retention (Vertical-nand Flash Memory With an Intercell Charge Trap Layer for the Improvement of Erase Efficiency and Data Retention)
  Media name/outlet	Information Technology Daily
  Country/Territory	United States
  Date	26.04.21
  Persons	Woo-Young Choi