Study Data from Jeonbuk National University Update Understanding of Technology (Structural and Electrical Characteristics of Ultra-thin Si-doped Gan Film Regrown On Patterned Gan/sapphire)

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• Research output

• Structural and electrical characteristics of ultra-thin Si-doped GaN film regrown on patterned GaN/sapphire

  Research output: Contribution to journal › Journal article › peer-review