A CMOS bandgap reference voltage generator with reduced voltage variation and BJT area

  • Seong Ik Cho*
  • , Hang Geun Jeong
  • , Hong Kyu Shin
  • , Young Hee Kim
  • *Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

Abstract

This paper proposes a new bandgap reference (BGR) circuit which adopts a cascode current mirror biasing for reducing the reference voltage variation and a novel sizing method for reducing the PNP BJT area. The proposed BGR was designed and fabricated using 0.18 μm triple-well CMOS process which provides only normal VTH transistors. The reference voltage variation of BGR was reduced from 0.5 mV (conventional) to 0.09 mV (proposed) using cascode current mirror biasing method. And the ratio of BJT emitter areas was reduced by a factor of 20 through the novel sizing method.

Original languageEnglish
Pages (from-to)92-95
Number of pages4
JournalCurrent Applied Physics
Volume7
Issue number1
DOIs
StatePublished - 2007.01

Keywords

  • Bandgap reference (BGR)
  • Cascode current mirror

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Physics & Astronomy

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