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A computational study on the growth and composition of InGaAsP film in a horizontal MOCVD reactor

  • Dong Seok Kim*
  • , Ik Tae Im
  • , Woo Seung Kim
  • *Corresponding author for this work
  • Hanyang University
  • Iksan National College

Research output: Contribution to conferenceConference paperpeer-review

Abstract

Distribution of growth rate and composition of InGaAsP films along the reactor length direction grown by metalorganic chemical vapor deposition process were studied using computational methods. The influences of process parameters such as pressure, temperature and precursors inlet partial pressures on the growth rate and composition distributions are analyzed. Trimethyl-indium, trimethyl-gallium, tertiary-butylarsine and tertiary-butylphosphine were used as precursors and hydrogen as dilution gas. The reaction model includes 4 gas-phase reactions and 8 surface reactions. Predicted values of the growth rate and composition were compared to the experimental results to validate the numerical model. The influences of heater temperature and operating pressure were analyzed thereafter.

Original languageEnglish
Title of host publicationCOMMAD04 - 2004 Conference on Optoelectronic and Microelectronic Materials and Devices -Proceedings
Pages101-104
Number of pages4
DOIs
StatePublished - 2005
EventCOMMAD04 - 2004 Conference on Optoelectronic and Microelectronic Materials and Devices - Bribane, QLD, Australia
Duration: 2004.12.82004.12.10

Publication series

NameConference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

Conference

ConferenceCOMMAD04 - 2004 Conference on Optoelectronic and Microelectronic Materials and Devices
Country/TerritoryAustralia
CityBribane, QLD
Period04.12.804.12.10

Keywords

  • InGaAsP
  • Metalorganic chemical vapor deposition (MOCVD)
  • Numerical simulation

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