Analysis of Contributing Factors for Determining theReliability Characteristics of GaN-BasedWhite Light-Emitting Diodes WithDual Degradation Kinetics

Hyunsoo Kim

Analysis of Contributing Factors for Determining theReliability Characteristics of GaN-BasedWhite Light-Emitting Diodes WithDual Degradation Kinetics

Hyunsoo Kim

Department of Semiconductor Science and Technology

Research output: Contribution to journal › Journal article › peer-review

Original language	Korean
Journal	IEEE Transactions on Electron Devices
State	Published - 2013.01.1

Cite this

@article{4245f894e6cf41aab99c50baa89d45c6,

title = "Analysis of Contributing Factors for Determining theReliability Characteristics of GaN-BasedWhite Light-Emitting Diodes WithDual Degradation Kinetics",

author = "Hyunsoo Kim",

year = "2013",

month = jan,

day = "1",

language = "Korean",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

}