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Analysis of the temperature dependence of the forward voltage characteristics of GaInN light-emitting diodes

  • David S. Meyaard
  • , Jaehee Cho
  • , E. Fred Schubert
  • , Sang Heon Han
  • , Min Ho Kim
  • , Cheolsoo Sone
  • Rensselaer Polytechnic Institute
  • Samsung

Research output: Contribution to journalJournal articlepeer-review

Abstract

The forward voltage characteristics of GaInN light-emitting diodes are studied in the temperature range of 80 K to 450 K. The forward-voltage-vs.- temperature curve has a "two-slope" characteristic with a slope of dVf/dT = -1.7 mV/K and -8.0 mV/K at room temperature and cryogenic temperatures, respectively. To investigate the two-slope characteristic, we perform transmission-line-model measurements on p-type GaN and show that both p-type contact and sheet resistance decrease drastically with increasing temperature. We conclude that dVf/dT in the high-slope region is limited by p-type sheet and contact resistance, and in the low-slope region by the GaN pn junction properties.

Original languageEnglish
Article number121103
JournalApplied Physics Letters
Volume103
Issue number12
DOIs
StatePublished - 2013.09.16

Quacquarelli Symonds(QS) Subject Topics

  • Physics & Astronomy

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