Abstract
Microstructural changes related to the critical current density dependence on film thickness in superconducting YBa 2Cu 3O 7-δ (YBCO) films have been investigated through electron microscopy. Pulsed laser deposited YBCO films ranging in thickness from 0.19 to 6.4 μm were grown on rolling assisted biaxially textured substrates (RABiTS) having two different buffer layer architectures. Remarkable improvements in the YBCO microstructure were observed in samples deposited on Ni-3%W, with a thick Y 2O 3 seed layer. Films grown on this structure showed little random oriented grain formations along with minimal interfacial reactions. The causes of reduced performance with increased film thickness will be addressed for both RABiTS architectures.
| Original language | English |
|---|---|
| Pages | 113-122 |
| Number of pages | 10 |
| State | Published - 2004 |
| Event | Fabrication of Long-Length and Bulk High-Temperature Superconductors - Nashville, TN., United States Duration: 2003.04.27 → 2003.04.30 |
Conference
| Conference | Fabrication of Long-Length and Bulk High-Temperature Superconductors |
|---|---|
| Country/Territory | United States |
| City | Nashville, TN. |
| Period | 03.04.27 → 03.04.30 |
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