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Analytical transmission electron microscopy of thick YBa 2Cu 3O 7-δ films on rabits

  • Keith J. Leonard*
  • , Sukill Kang
  • , Byeongwon Kang
  • , Amit Goyal
  • , Donald M. Kroeger
  • *Corresponding author for this work
  • Oak Ridge National Laboratory
  • Pohang University of Science and Technology

Research output: Contribution to conferencePaperpeer-review

Abstract

Microstructural changes related to the critical current density dependence on film thickness in superconducting YBa 2Cu 3O 7-δ (YBCO) films have been investigated through electron microscopy. Pulsed laser deposited YBCO films ranging in thickness from 0.19 to 6.4 μm were grown on rolling assisted biaxially textured substrates (RABiTS) having two different buffer layer architectures. Remarkable improvements in the YBCO microstructure were observed in samples deposited on Ni-3%W, with a thick Y 2O 3 seed layer. Films grown on this structure showed little random oriented grain formations along with minimal interfacial reactions. The causes of reduced performance with increased film thickness will be addressed for both RABiTS architectures.

Original languageEnglish
Pages113-122
Number of pages10
StatePublished - 2004
EventFabrication of Long-Length and Bulk High-Temperature Superconductors - Nashville, TN., United States
Duration: 2003.04.272003.04.30

Conference

ConferenceFabrication of Long-Length and Bulk High-Temperature Superconductors
Country/TerritoryUnited States
CityNashville, TN.
Period03.04.2703.04.30

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