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Calculation of characteristic impedance of transmission lines with substrate integrated artificial dielectric structures

  • Jongsik Lim*
  • , Jun Lee
  • , Jaehoon Lee
  • , Yongchae Jeong
  • , Sang Min Han
  • , Kwan Sun Choi
  • , Dal Ahn
  • *Corresponding author for this work

Research output: Contribution to conferenceConference paperpeer-review

Abstract

A calculation method for the characteristic impedance of transmission lines with any perturbation structure is proposed. An analytical procedure is described with proper equations based on simple transmission line theories. The obtained characteristic impedance by the proposed method shows an almost constant value, while it fluctuates severely depending on the frequency in the conventional method. As a sample transmission line element, a microstrip line with the substrate integrated artificial dielectric (SIAD) structure is selected for calculating the characteristic impedance by the proposed method. The calculated characteristic impedances from the simulated and measured S-parameters well converge to a constant value without fluctuation.

Original languageEnglish
Title of host publicationTENCON 2010 - 2010 IEEE Region 10 Conference
Pages1632-1635
Number of pages4
DOIs
StatePublished - 2010
Event2010 IEEE Region 10 Conference, TENCON 2010 - Fukuoka, Japan
Duration: 2010.11.212010.11.24

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON

Conference

Conference2010 IEEE Region 10 Conference, TENCON 2010
Country/TerritoryJapan
CityFukuoka
Period10.11.2110.11.24

Quacquarelli Symonds(QS) Subject Topics

  • Computer Science & Information Systems
  • Engineering - Electrical & Electronic
  • Engineering - Petroleum
  • Data Science

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