Abstract
Data and analysis are presented employing several new methods to address carrier dynamics and photon management issues in order to improve internal quantum efficiency and light-extraction efficiency of GaN-based light-emitting diodes. For the carrier dynamics, studied are the effects of a newly-developed InAlN electron blocking layer and a p-InGaN:Mg layer on electron blocking and hole transport through multiple-quantum well active region. Also, a new technique of direct surface patterning is demonstrated using three-beam interference laser ablation for efficient photon management.
| Original language | English |
|---|---|
| Pages (from-to) | 109-116 |
| Number of pages | 8 |
| Journal | ECS Transactions |
| Volume | 61 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2014 |
| Event | Symposium on Wide Bandgap Semiconductor Materials and Devices 15 - 225th ECS Meeting - Orlando, United States Duration: 2014.05.11 → 2014.05.15 |
Quacquarelli Symonds(QS) Subject Topics
- Engineering & Technology
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