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Change in electrical characteristics of gallium phosphide nanowire transistors under different environments

  • Donghun Kang*
  • , Wanjun Park
  • , Byungkye Kim
  • , Jujin Kim
  • , Cheoljin Lee
  • *Corresponding author for this work
  • Samsung
  • Jeonbuk National University
  • Hanyang University

Research output: Contribution to conferenceConference paperpeer-review

Abstract

Gallium phosphide (GaP) nanowire transistors were fabricated in a back gated structure and their electrical characteristics were measured systematically in air and vacuum. Typically the transistors turn on at -7 to -5V in ambient air. However, in vacuum, a large Vth shift about ∼10V toward the negative gate bias was observed. Exposure to air for 48 hours shifts the Vth back to the original Vth in air, which implies a reversible Vth shift. We believe that the shift of Vth is associated with charge transfer between physically adsorbed O or OH species and the surface of GaP nanowire. The device operation can be explained by conventional n-channel depletion type MOSFET operation.

Original languageEnglish
Title of host publication2004 4th IEEE Conference on Nanotechnology
Pages370-372
Number of pages3
StatePublished - 2004
Event2004 4th IEEE Conference on Nanotechnology - Munich, Germany
Duration: 2004.08.162004.08.19

Publication series

Name2004 4th IEEE Conference on Nanotechnology

Conference

Conference2004 4th IEEE Conference on Nanotechnology
Country/TerritoryGermany
CityMunich
Period04.08.1604.08.19

Keywords

  • Environment effects
  • Gallium phosphide
  • Nano electronics
  • Nanowire transistors

Quacquarelli Symonds(QS) Subject Topics

  • Engineering & Technology

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