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Characteristic enhancement of the blue LED chip by the growth and fabrication on patterned sapphire (0 0 0 1) substrate

  • Seong Muk Jeong
  • , Suthan Kissinger
  • , Dong Wook Kim
  • , Seung Jae Lee
  • , Jin Soo Kim
  • , Haeng Keun Ahn
  • , Cheul Ro Lee*
  • *Corresponding author for this work
  • Research Center for Advanced Materials Development (RCAMD)
  • Korea Photonics Technology Institute

Research output: Contribution to journalJournal articlepeer-review

Abstract

Blue light-emitting diodes (LEDs) with an InGaN multi-quantum well (MQW) structure were fabricated on a patterned sapphire substrate (PSS) using a single growth process of metal organic chemical vapor deposition (MOCVD). The electrical and optical properties of these LEDs were investigated. The crystal quality of epitaxial GaN film was improved by using the PSS structure. At 40 mA injection current, the peak wavelength and the full-width at half-maximum of the electroluminescence spectra of PSS were 461 and 24 nm, respectively. The electroluminescence intensity (EL) of LEDs grown on patterned substrate was 2.44 times greater than that of unpatterened sapphire substrate (UPSS). The operating voltage was measured about 3.1 V for the LED with a PSS structure. This significant increase resulted from the improvement of the epitaxial quality of the InGaN/GaN epilayers and the improvement of the light extraction efficiency through patterned sapphire substrates.

Original languageEnglish
Pages (from-to)258-262
Number of pages5
JournalJournal of Crystal Growth
Volume312
Issue number2
DOIs
StatePublished - 2010.01.1

Keywords

  • A3. MOCVD
  • B1. GaN
  • B1. Patterned sapphire substrate
  • B3. Light-emitting diodes

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