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Characteristics of Si-doped GaN compensated with Mg

  • Jae Young Leem*
  • , Cheul Ro Lee
  • , Joo In Lee
  • , Sam Kyu Noh
  • , Young Soo Kwon
  • , Yeun Hee Ryu
  • , Sung Jin Son
  • *Corresponding author for this work
  • Korea Research Institute of Standards and Science
  • Kyung Hee University
  • Jeonbuk National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

We have investigated the effect of Si-Mg codoping on the yellow luminescence. The codoped GaN films with GaN buffer layers were grown by introducing various SiH4 flow rates (2-10 seem) and constant Cp2Mg flow rate (3 sccm) at the same time. All the codoped GaN epilayers measured by Hall effect were n-type, leading to electron concentration from 2 × 1018 up to 5 × 1019 cm-3. From the photoluminescence spectra, the integrated intensity ratio of the yellow luminescence to the band-edge emission of the codoped GaN samples is lower than that of the GaN samples doped with the Si donors alone, regardless of the electron concentration and the measuring temperature. We interpret that the Ga vacancy (VGa) is responsible for the yellow luminescence.

Original languageEnglish
Pages (from-to)491-495
Number of pages5
JournalJournal of Crystal Growth
Volume193
Issue number4
DOIs
StatePublished - 1998.10.15

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Chemistry
  • Physics & Astronomy

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