Skip to main navigation Skip to search Skip to main content

Coexistence of unipolar and bipolar resistive switching characteristics in ZnO thin films

  • Seunghyup Lee*
  • , Heejin Kim
  • , Jinjoo Park
  • , Kijung Yong
  • *Corresponding author for this work
  • Pohang University of Science and Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

This paper reports the coexistence of unipolar and bipolar resistive switching (BRS) in an Ag/ZnO/Pt structure fabricated by sputtering deposition at room temperature. The structure shows reproducible and stable unipolar resistive switching after electroforming with high compliance current (I c) =40 mA, regardless of the applied voltage polarity. With low Ic =5 mA at electroforming, BRS was also observed; this phenomenon depended on the voltage polarity. Both states were stable and reproducible over 100 cycles. The switching mode was changed with adjusting Ic but the transition was irreversible. Based on the results, switching mechanism based on filament theory is proposed to explain both resistive switching.

Original languageEnglish
Article number076101
JournalJournal of Applied Physics
Volume108
Issue number7
DOIs
StatePublished - 2010.10.1

Fingerprint

Dive into the research topics of 'Coexistence of unipolar and bipolar resistive switching characteristics in ZnO thin films'. Together they form a unique fingerprint.

Cite this