Correction to: Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8)

Minah Park; Jaewook Yoo; Hongseung Lee; Hyeonjun Song; Soyeon Kim; Seongbin Lim; Seohyeon Park; Jo Hak Jeong; Bongjoong Kim; Kiyoung Lee; Yoon Kyeung Lee; Keun Heo; Jiseok Kwon; Hagyoul Bae

doi:10.1007/s13391-024-00536-6

Correction to: Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8)

Minah Park
, Jaewook Yoo
, Hongseung Lee
, Hyeonjun Song
, Soyeon Kim
, Seongbin Lim
, Seohyeon Park
, Jo Hak Jeong
, Bongjoong Kim
, Kiyoung Lee
, Yoon Kyeung Lee
, Keun Heo
, Jiseok Kwon^*
, Hagyoul Bae^*

^*Corresponding author for this work

Jeonbuk National University
Hongik University
The Catholic University of Korea

Research output: Contribution to journal › Comment/debate

Abstract

In this article the Acknowledgements section was incorrectly given as ‘This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (2024-RS-2024-00439292 and No. 2022R1F1A1071914) and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC).’ but should have been ‘This work was supported by the Nano & Material Technology Development Program through the National Research Foundation of Korea (NRF) funded by Ministry of Science and ICT (MSIT) (RS-2024-00460372), the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIT) (2022R1F1A1071914), in part by the Institute of Information & Communications Technology Planning & Evaluation (IITP)-Innovative Human Resource Development for Local Intellectualization program grant funded by the Korean government (IITP-2024-RS-2024-00439292), and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC)’. The original article has been corrected.

Original language	English
Pages (from-to)	289
Number of pages	1
Journal	Electronic Materials Letters
Volume	21
Issue number	2
DOIs	https://doi.org/10.1007/s13391-024-00536-6
State	Published - 2025.03

Quacquarelli Symonds(QS) Subject Topics

Materials Science

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Park, M., Yoo, J., Lee, H., Song, H., Kim, S., Lim, S., Park, S., Jeong, J. H., Kim, B., Lee, K., Lee, Y. K., Heo, K., Kwon, J., & Bae, H. (2025). Correction to: Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8). Electronic Materials Letters, 21(2), 289. https://doi.org/10.1007/s13391-024-00536-6

@article{5b76586e020d43478a4570c46cb5186a,

title = "Correction to: Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8)",

abstract = "In this article the Acknowledgements section was incorrectly given as {\textquoteleft}This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (2024-RS-2024-00439292 and No. 2022R1F1A1071914) and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC).{\textquoteright} but should have been {\textquoteleft}This work was supported by the Nano \& Material Technology Development Program through the National Research Foundation of Korea (NRF) funded by Ministry of Science and ICT (MSIT) (RS-2024-00460372), the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIT) (2022R1F1A1071914), in part by the Institute of Information \& Communications Technology Planning \& Evaluation (IITP)-Innovative Human Resource Development for Local Intellectualization program grant funded by the Korean government (IITP-2024-RS-2024-00439292), and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC){\textquoteright}. The original article has been corrected.",

author = "Minah Park and Jaewook Yoo and Hongseung Lee and Hyeonjun Song and Soyeon Kim and Seongbin Lim and Seohyeon Park and Jeong, \{Jo Hak\} and Bongjoong Kim and Kiyoung Lee and Lee, \{Yoon Kyeung\} and Keun Heo and Jiseok Kwon and Hagyoul Bae",

note = "Publisher Copyright: {\textcopyright} The Author(s) under exclusive licence to The Korean Institute of Metals and Materials 2024.",

year = "2025",

month = mar,

doi = "10.1007/s13391-024-00536-6",

language = "English",

volume = "21",

pages = "289",

journal = "Electronic Materials Letters",

issn = "1738-8090",

number = "2",

}

Park, M, Yoo, J, Lee, H, Song, H, Kim, S, Lim, S, Park, S, Jeong, JH, Kim, B, Lee, K, Lee, YK , Heo, K, Kwon, J & Bae, H 2025, 'Correction to: Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8)', Electronic Materials Letters, vol. 21, no. 2, pp. 289. https://doi.org/10.1007/s13391-024-00536-6

Correction to: Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8). / Park, Minah; Yoo, Jaewook; Lee, Hongseung et al.
In: Electronic Materials Letters, Vol. 21, No. 2, 03.2025, p. 289.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Correction to

T2 - Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8)

AU - Park, Minah

AU - Yoo, Jaewook

AU - Lee, Hongseung

AU - Song, Hyeonjun

AU - Kim, Soyeon

AU - Lim, Seongbin

AU - Park, Seohyeon

AU - Jeong, Jo Hak

AU - Kim, Bongjoong

AU - Lee, Kiyoung

AU - Lee, Yoon Kyeung

AU - Heo, Keun

AU - Kwon, Jiseok

AU - Bae, Hagyoul

PY - 2025/3

Y1 - 2025/3

N2 - In this article the Acknowledgements section was incorrectly given as ‘This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (2024-RS-2024-00439292 and No. 2022R1F1A1071914) and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC).’ but should have been ‘This work was supported by the Nano & Material Technology Development Program through the National Research Foundation of Korea (NRF) funded by Ministry of Science and ICT (MSIT) (RS-2024-00460372), the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIT) (2022R1F1A1071914), in part by the Institute of Information & Communications Technology Planning & Evaluation (IITP)-Innovative Human Resource Development for Local Intellectualization program grant funded by the Korean government (IITP-2024-RS-2024-00439292), and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC)’. The original article has been corrected.

AB - In this article the Acknowledgements section was incorrectly given as ‘This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (2024-RS-2024-00439292 and No. 2022R1F1A1071914) and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC).’ but should have been ‘This work was supported by the Nano & Material Technology Development Program through the National Research Foundation of Korea (NRF) funded by Ministry of Science and ICT (MSIT) (RS-2024-00460372), the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIT) (2022R1F1A1071914), in part by the Institute of Information & Communications Technology Planning & Evaluation (IITP)-Innovative Human Resource Development for Local Intellectualization program grant funded by the Korean government (IITP-2024-RS-2024-00439292), and “Research Base Construction Fund Support Program” funded by Jeonbuk National University. The EDA tool was supported in part by the IC Design Education Center (IDEC)’. The original article has been corrected.

UR - https://www.scopus.com/pages/publications/105001079414

U2 - 10.1007/s13391-024-00536-6

DO - 10.1007/s13391-024-00536-6

M3 - Comment/debate

AN - SCOPUS:105001079414

SN - 1738-8090

VL - 21

SP - 289

JO - Electronic Materials Letters

JF - Electronic Materials Letters

IS - 2

ER -

Correction to: Rapid Thermal Annealing under O2 Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs (Electronic Materials Letters, (2025), 21, 1, (111-118), 10.1007/s13391-024-00526-8)

Abstract

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