Crystal-dithering method applied to spectral phase interferometry for direct electric-field reconstruction (SPIDER) for sensitivity enhancement of the pulse phase measurement

Baatarchuluun Tsermaa; Byeong Kwan Yang; Jin Seung Kim; Kim Myung-Whun

doi:10.1016/j.optcom.2010.11.081

Crystal-dithering method applied to spectral phase interferometry for direct electric-field reconstruction (SPIDER) for sensitivity enhancement of the pulse phase measurement

Baatarchuluun Tsermaa
, Byeong Kwan Yang
, Jin Seung Kim
, Kim Myung-Whun^*

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Journal article › peer-review

6 Scopus citations

Abstract

The application of a crystal-dithering technique to the spectral phase interferometry for direct electric-field reconstruction (SPIDER) was experimentally demonstrated. Applying a crystal-dithering technique to SPIDER resulted in the improvement of the measurement sensitivity. In our approach, a 20 μm-thick nonlinear crystal for a thin-crystal SPIDER method was replaced by a 100 μm-thick crystal, and the crystal was dithered. The improvement was confirmed by comparing the statistical error of the crystal-dithering SPIDER to the statistical error of the thin-crystal SPIDER method. The dispersion of a BK7 plate was investigated to evaluate the reliability of the proposed approach.

Original language	English
Pages (from-to)	1955-1958
Number of pages	4
Journal	Optics Communications
Volume	284
Issue number	7
DOIs	https://doi.org/10.1016/j.optcom.2010.11.081
State	Published - 2011.04.1

Quacquarelli Symonds(QS) Subject Topics

Materials Science
Engineering - Electrical & Electronic
Engineering - Petroleum
Chemistry
Physics & Astronomy

Access to Document

10.1016/j.optcom.2010.11.081

Cite this

@article{b869a40833d140a5ab866783042ba008,

title = "Crystal-dithering method applied to spectral phase interferometry for direct electric-field reconstruction (SPIDER) for sensitivity enhancement of the pulse phase measurement",

abstract = "The application of a crystal-dithering technique to the spectral phase interferometry for direct electric-field reconstruction (SPIDER) was experimentally demonstrated. Applying a crystal-dithering technique to SPIDER resulted in the improvement of the measurement sensitivity. In our approach, a 20 μm-thick nonlinear crystal for a thin-crystal SPIDER method was replaced by a 100 μm-thick crystal, and the crystal was dithered. The improvement was confirmed by comparing the statistical error of the crystal-dithering SPIDER to the statistical error of the thin-crystal SPIDER method. The dispersion of a BK7 plate was investigated to evaluate the reliability of the proposed approach.",

author = "Baatarchuluun Tsermaa and Yang, \{Byeong Kwan\} and Kim, \{Jin Seung\} and Kim Myung-Whun",

year = "2011",

month = apr,

day = "1",

doi = "10.1016/j.optcom.2010.11.081",

language = "English",

volume = "284",

pages = "1955--1958",

journal = "Optics Communications",

issn = "0030-4018",

number = "7",

}

Crystal-dithering method applied to spectral phase interferometry for direct electric-field reconstruction (SPIDER) for sensitivity enhancement of the pulse phase measurement. / Tsermaa, Baatarchuluun; Yang, Byeong Kwan; Kim, Jin Seung et al.
In: Optics Communications, Vol. 284, No. 7, 01.04.2011, p. 1955-1958.

Research output: Contribution to journal › Journal article › peer-review

TY - JOUR

T1 - Crystal-dithering method applied to spectral phase interferometry for direct electric-field reconstruction (SPIDER) for sensitivity enhancement of the pulse phase measurement

AU - Tsermaa, Baatarchuluun

AU - Yang, Byeong Kwan

AU - Kim, Jin Seung

AU - Myung-Whun, Kim

PY - 2011/4/1

Y1 - 2011/4/1

N2 - The application of a crystal-dithering technique to the spectral phase interferometry for direct electric-field reconstruction (SPIDER) was experimentally demonstrated. Applying a crystal-dithering technique to SPIDER resulted in the improvement of the measurement sensitivity. In our approach, a 20 μm-thick nonlinear crystal for a thin-crystal SPIDER method was replaced by a 100 μm-thick crystal, and the crystal was dithered. The improvement was confirmed by comparing the statistical error of the crystal-dithering SPIDER to the statistical error of the thin-crystal SPIDER method. The dispersion of a BK7 plate was investigated to evaluate the reliability of the proposed approach.

AB - The application of a crystal-dithering technique to the spectral phase interferometry for direct electric-field reconstruction (SPIDER) was experimentally demonstrated. Applying a crystal-dithering technique to SPIDER resulted in the improvement of the measurement sensitivity. In our approach, a 20 μm-thick nonlinear crystal for a thin-crystal SPIDER method was replaced by a 100 μm-thick crystal, and the crystal was dithered. The improvement was confirmed by comparing the statistical error of the crystal-dithering SPIDER to the statistical error of the thin-crystal SPIDER method. The dispersion of a BK7 plate was investigated to evaluate the reliability of the proposed approach.

UR - https://www.scopus.com/pages/publications/79951671658

U2 - 10.1016/j.optcom.2010.11.081

DO - 10.1016/j.optcom.2010.11.081

M3 - Journal article

AN - SCOPUS:79951671658

SN - 0030-4018

VL - 284

SP - 1955

EP - 1958

JO - Optics Communications

JF - Optics Communications

IS - 7

ER -

Crystal-dithering method applied to spectral phase interferometry for direct electric-field reconstruction (SPIDER) for sensitivity enhancement of the pulse phase measurement

Abstract

Quacquarelli Symonds(QS) Subject Topics

Access to Document

Other files and links

Fingerprint

Cite this