Abstract
The fabrication process and design issues for the fabrication of vertical-injection GaN-based light-emitting diodes were investigated. The process yield was reduced according to the adhesion of reflective p-electrodes, the exposure of electroplated metal in plasma, and wet-etching induced surface textures. The chip design utilizing current blocking layer and branched n-electrode was found to significantly affect the power efficiency of LEDs.
| Original language | English |
|---|---|
| Pages (from-to) | A937-A942 |
| Journal | Optics Express |
| Volume | 19 |
| Issue number | 104 |
| DOIs | |
| State | Published - 2011.07.4 |
Quacquarelli Symonds(QS) Subject Topics
- Physics & Astronomy
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