@inproceedings{bf2a4c637b0143368330dc5ceb315d08,
title = "Determination of micro-structural properties with x-ray absorption fine structure",
abstract = "The structural properties including bonding lengths and their disorders of the nanomaterials are fundamental to understand their properties. Diffraction is a canonical method to measure the crystalline structure. However, it has a limit to detect the structures from the materials which are not well crystallized or amorphous. Extended X-ray absorption fine structure (EXAFS) can describe the atomic species, bonding lengths and coordination number around a selected species atom, independent of the crystallinity, size or shape of specimens. We accurately determined the local structural properties of ZnO nanostructures with EXAFS and illustrated the growth mechanism of vertically aligned ZnO nanorods.",
keywords = "Disorder, EXAFS, Nanorod, Structure, ZnO",
author = "Han, \{S. W.\} and Yu, \{H. J.\} and Jeong, \{E. S.\} and Park, \{S. H.\} and Seo, \{S. Y.\} and Kwak, \{C. H.\} and Kim, \{S. H.\}",
year = "2007",
language = "English",
isbn = "1420063421",
series = "2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings",
pages = "9--12",
booktitle = "2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings",
note = "2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007 ; Conference date: 20-05-2007 Through 24-05-2007",
}