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Development of LC-type ESD/EMI filter based on TVS devices for peripheral device applications

  • Daoheung Bouangeune
  • , Woong Ki Hong
  • , Sang Sik Choi
  • , Chel Jong Choi
  • , Deok Ho Cho
  • , Kyu Hwan Shim*
  • , Young Gi Kim
  • *Corresponding author for this work
  • Jeonbuk National University
  • Sigetronics, Inc.
  • Anyang University

Research output: Contribution to conferenceConference paperpeer-review

Abstract

A fully integrated LC-type ESD/EMI filter was developed by the integrated passive devices (IPD) technology. Unique TVS diodes are employed to enhance its performance while maintaining robust ESD characteristics. The reliability and performance of ESD/EMI filter are confirmed based on both attenuation and electrostatic discharge (ESD) strength which could be evaluated by insertion loss (S parameter), ESD and transmission line pulse (TLP) testing method. As the results, the device shows very low leakage current less than 1nA. Its ESD protection and attenuation could be robustness exceed 28 A TLP and ±17 kV IEC 61000-4-2 and achieved as >35 dB at 800 MHz ∼3 GHz, respectively. The cut off frequency obtained of 160 MHz that can ensure high-speed data communication applications.

Original languageEnglish
Title of host publication1st IEEE Global Conference on Consumer Electronics 2012, GCCE 2012
Pages444-447
Number of pages4
DOIs
StatePublished - 2012
Event1st IEEE Global Conference on Consumer Electronics, GCCE 2012 - Tokyo, Japan
Duration: 2012.10.22012.10.5

Publication series

Name1st IEEE Global Conference on Consumer Electronics 2012, GCCE 2012

Conference

Conference1st IEEE Global Conference on Consumer Electronics, GCCE 2012
Country/TerritoryJapan
CityTokyo
Period12.10.212.10.5

Keywords

  • EMI
  • ESD
  • Filter
  • S-parameter
  • TLP
  • TVS

Quacquarelli Symonds(QS) Subject Topics

  • Engineering - Electrical & Electronic
  • Engineering - Petroleum

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