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Device performance enhancement via a Si-rich silicon oxynitride buffer layer for the organic photodetecting device

  • Sung Heo
  • , Jooho Lee
  • , Seong Heon Kim
  • , Dong Jin Yun
  • , Jong Bong Park
  • , Kihong Kim
  • , Nam Jeong Kim
  • , Yongsung Kim
  • , Dongwook Lee
  • , Kyu Sik Kim*
  • , Hee Jae Kang
  • *Corresponding author for this work
  • Samsung
  • Chungbuk National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

An advanced organic photodetector (OPD) with a butter layer of Si-rich silicon oxynitride (SiOxNy) was fabricated. The detector structure is as follows: Indium tin oxide (ITO) coated glass substrate/SiOxNy(10 nm)/naphthalene-based donor:C60(1:1)/ITO. Values of x and y in SiOxNy were carefully controlled and the detector performances such as dark current and thermal stability were investigated. When the values of x and y are 0.16 and 0.66, the detector illustrates low dark current as well as excellent thermal stability. In the OPD, silicon oxynitride layer works as electron barrier under reverse bias, leading to the decrease of dark current and increase of detectivity. Since the band gap of silicon oxynitride unlike conventional buffer layers can also be controlled by adjusting x and y values, it can be adapted into various photodiode applications.

Original languageEnglish
Article number1516
JournalScientific Reports
Volume7
Issue number1
DOIs
StatePublished - 2017.12.1

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