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Dewetting of Thin Polymer Films on Wrinkled Graphene Oxide Monolayers

  • Kyoung Il Jo
  • , Tae Ho Kim
  • , Ki In Choi
  • , Hoyeon Lee
  • , Jae Hak Choi
  • , Joona Bang
  • , Tae Hwan Kim
  • , Guangcui Yuan
  • , Sushil K. Satija
  • , Jaseung Koo*
  • *Corresponding author for this work
  • Korea Atomic Energy Research Institute
  • Korea University
  • Chungnam National University
  • National Institute of Standards and Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

We investigated the effect of the morphological structure of a graphene oxide (GO) monolayer on the dewetting dynamics of the upper polymer thin films. The Langmuir-Schaefer (LS) technique was used to prepare a wrinkled GO (wrGO) structure with a root mean square (rms) roughness of 22.7 Å. The dewetting behavior of poly(methyl methacrylate) (PMMA) thin films on the wrGO monolayers was perfectly prevented, whereas the PMMA thin films on a flat GO monolayer were dewetted at 203 °C. This wrinkle effect of the GO can be also obtained when the GOs monolayers are intercalated to the PMMA/polystyrene (PS) interface. In this multilayer, the flat GO monolayer at the interface between the PS and PMMA layers was spontaneously roughened with rms roughness of 46.9 Å after annealing and also prohibited the dewetting behavior. From the results, we found that to improve the compatibility of polymer blends by adding the two-dimensional nanosheets, it is important to control the morphological structure of the sheets at the interface, along with manipulation of the GO-polymer interactions.

Original languageEnglish
Pages (from-to)5549-5556
Number of pages8
JournalLangmuir
Volume35
Issue number16
DOIs
StatePublished - 2019.04.23

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Chemistry
  • Physics & Astronomy

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