Differences in nature of defects between SrBi2Ta2O9 and Bi4Ti3O12

B. H. Park; S. J. Hyun; S. D. Bu; T. W. Noh; J. Lee; H. D. Kim; T. H. Kim; W. Jo

doi:10.1063/1.123709

Differences in nature of defects between SrBi₂Ta₂O₉ and Bi₄Ti₃O₁₂

B. H. Park^*
, S. J. Hyun
, S. D. Bu
, T. W. Noh
, J. Lee
, H. D. Kim
, T. H. Kim
, W. Jo

^*Corresponding author for this work

Department of Physics

Seoul National University
Sungkyunkwan University
University of Seoul
LG Corporation

Research output: Contribution to journal › Journal article › peer-review

243 Scopus citations

Abstract

The nature of defect differences between SrBi₂Ta₂O₉ (SBT) and Bi₄Ti₃O₁₂ (BTO) films is investigated using X-ray photoemission spectroscopy. The oxygen ions for SBT at the SrTa₂O₇ perovskite layers are much stable than those at the Bi₂O₂ layers. While oxygen vacancies on the BTO films could be induced both at the titanium-oxygen octahedra and at the Bi₂O₂ layers.

Original language	English
Pages (from-to)	1907-1909
Number of pages	3
Journal	Applied Physics Letters
Volume	74
Issue number	13
DOIs	https://doi.org/10.1063/1.123709
State	Published - 1999.03.29

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10.1063/1.123709

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title = "Differences in nature of defects between SrBi2Ta2O9 and Bi4Ti3O12",

abstract = "The nature of defect differences between SrBi2Ta2O9 (SBT) and Bi4Ti3O12 (BTO) films is investigated using X-ray photoemission spectroscopy. The oxygen ions for SBT at the SrTa2O7 perovskite layers are much stable than those at the Bi2O2 layers. While oxygen vacancies on the BTO films could be induced both at the titanium-oxygen octahedra and at the Bi2O2 layers.",

author = "Park, \{B. H.\} and Hyun, \{S. J.\} and Bu, \{S. D.\} and Noh, \{T. W.\} and J. Lee and Kim, \{H. D.\} and Kim, \{T. H.\} and W. Jo",

year = "1999",

month = mar,

day = "29",

doi = "10.1063/1.123709",

language = "English",

volume = "74",

pages = "1907--1909",

journal = "Applied Physics Letters",

issn = "0003-6951",

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TY - JOUR

T1 - Differences in nature of defects between SrBi2Ta2O9 and Bi4Ti3O12

AU - Park, B. H.

AU - Hyun, S. J.

AU - Bu, S. D.

AU - Noh, T. W.

AU - Lee, J.

AU - Kim, H. D.

AU - Kim, T. H.

AU - Jo, W.

PY - 1999/3/29

Y1 - 1999/3/29

N2 - The nature of defect differences between SrBi2Ta2O9 (SBT) and Bi4Ti3O12 (BTO) films is investigated using X-ray photoemission spectroscopy. The oxygen ions for SBT at the SrTa2O7 perovskite layers are much stable than those at the Bi2O2 layers. While oxygen vacancies on the BTO films could be induced both at the titanium-oxygen octahedra and at the Bi2O2 layers.

AB - The nature of defect differences between SrBi2Ta2O9 (SBT) and Bi4Ti3O12 (BTO) films is investigated using X-ray photoemission spectroscopy. The oxygen ions for SBT at the SrTa2O7 perovskite layers are much stable than those at the Bi2O2 layers. While oxygen vacancies on the BTO films could be induced both at the titanium-oxygen octahedra and at the Bi2O2 layers.

UR - https://www.scopus.com/pages/publications/0032621372

U2 - 10.1063/1.123709

DO - 10.1063/1.123709

M3 - Journal article

AN - SCOPUS:0032621372

SN - 0003-6951

VL - 74

SP - 1907

EP - 1909

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

ER -

Differences in nature of defects between SrBi₂Ta₂O₉ and Bi₄Ti₃O₁₂

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