Skip to main navigation Skip to search Skip to main content

Direct detection of fast-moving low-mass dark matter

  • Haider Alhazmi*
  • , Doojin Kim
  • , Kyoungchul Kong
  • , Gopolang Mohlabeng
  • , Jong Chul Park
  • , Seodong Shin
  • *Corresponding author for this work
  • Jazan University
  • University of South Dakota
  • Texas A&M University
  • University of Kansas
  • Simon Fraser University
  • TRIUMF
  • University of California at Irvine
  • Chungnam National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

We examine the signals produced by dark-matter interactions with electrons, which play a crucial role in direct detection experiments employing heavy target materials, particularly in many well-motivated sub-GeV dark-matter scenarios. When the momentum transfer to target electrons is comparable to or exceeds their binding energy, atomic effects related to electron ionization become essential for accurately determining signal rates—especially in the case of fast-moving dark matter. In this paper, we revisit and extend the atomic ionization formalism, systematically comparing different approaches used to formulate the ionization form factor and identifying their respective domains of validity. As practical applications, we explore detection prospects in xenon target experiments. To illustrate our findings, we consider a specific scenario involving boosted dark matter, which often leads to high-momentum electron recoils. Our analysis demonstrates that the choice of formalism can significantly influence the interpretation of experimental data, depending on the regions of parameter space.

Original languageEnglish
Article number095029
Pages (from-to)1-16
Number of pages16
JournalPhysical Review D
Volume112
Issue number9
DOIs
StatePublished - 2025.11.20

Fingerprint

Dive into the research topics of 'Direct detection of fast-moving low-mass dark matter'. Together they form a unique fingerprint.

Cite this