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Direct image observation of the initial forming of passive thin film on stainless steel surface by PEEM

  • Tai Hee Kang*
  • , Kyuwook Ihm
  • , Chan Cuk Hwang
  • , Cheolho Jeon
  • , Ki Jeong Kim
  • , Jae Young Kim
  • , Min Kyu Lee
  • , Hyun Joon Shin
  • , Bongsoo Kim
  • , Sukmin Chung
  • , Chong Yun Park
  • *Corresponding author for this work
  • Pohang University of Science and Technology
  • Sungkyunkwan University

Research output: Contribution to journalJournal articlepeer-review

Abstract

Vacuum thermal oxidation methods, which are based on the concept of selective oxidations of chromium at low oxygen partial pressures, have been used for practical fabrication of protective oxide films on stainless steels. This passive oxide films was characterized to investigate the chemical composition by surface-sensitive photoelectron spectroscopy (PES). PES revealed that the 10Å thickness of Cr 2 O 3 layer was formed in 450°C and oxygen partial pressure of 1×10 -9 Torr, and a top layer was mixed with metallic chromium and oxygen exited Cr 2 O 3 at the initial stage of oxidation. Photoemission electron microscope (PEEM) and the synchrotron radiation, which were tuned at the core level energy of iron and chromium components, were used to obtain the real time image acquisition of the initial forming phenomena with annealing process.

Original languageEnglish
Pages (from-to)630-635
Number of pages6
JournalApplied Surface Science
Volume212-213
Issue numberSPEC.
DOIs
StatePublished - 2003.05.15

Keywords

  • Passive chromium oxide thin film
  • Photoemission electron microscope
  • Stainless steel
  • Synchrotron radiation photoelectron spectroscopy

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