Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system

S. An; C. Stambaugh; S. Kwon; K. Lee; B. Kim; Q. Kim; W. Jhe

Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system

S. An
, C. Stambaugh
, S. Kwon
, K. Lee
, B. Kim
, Q. Kim
, W. Jhe

Department of Physics

Seoul National University
National Institute of Standards and Technology

Research output: Contribution to conference › Conference paper › peer-review

Abstract

We demonstrated direct observation of nanofabrication using the optical microscope (OM) combined with nanopipette/QTF-AFM (Quartz Tuning Fork-Atomic Force Microscopy) system. Various solutions are ejected onto the substrate through the nano-/micro-aperture of the pulled pipette, and the nano-/microscale objects were formed in on-demand spot of the surface with the patterning system. Lithography with various materials can be realized with any liquid solution and sample, such as nanoparticles, PDMS, nanowires by monitoring the fluid phenomena on the substrate with the home-made OM. After forming of capillary condensation between apex of the pipette tip and the surface, the electric field is applied to extract out the inside liquid to the substrate and the nano-microscale objects are fabricated. The nanoscale patterning size can be controlled by the aperture diameters of the pulled pipette.

Original language	English
Title of host publication	Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
Pages	477-480
Number of pages	4
State	Published - 2013
Event	Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 - Washington, DC, United States Duration: 2013.05.12 → 2013.05.16

Publication series

Name	Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
Volume	2

Conference

Conference	Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
Country/Territory	United States
City	Washington, DC
Period	13.05.12 → 13.05.16

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

Liquid delivery
Nano-Patterning
Nanopipette/QTF-AFM
PDMS

Cite this

An, S., Stambaugh, C., Kwon, S., Lee, K., Kim, B., Kim, Q., & Jhe, W. (2013). Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system. In Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 (pp. 477-480). (Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013; Vol. 2).

@inproceedings{ef8118c6af8c4a528138ff660890bc2a,

title = "Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system",

abstract = "We demonstrated direct observation of nanofabrication using the optical microscope (OM) combined with nanopipette/QTF-AFM (Quartz Tuning Fork-Atomic Force Microscopy) system. Various solutions are ejected onto the substrate through the nano-/micro-aperture of the pulled pipette, and the nano-/microscale objects were formed in on-demand spot of the surface with the patterning system. Lithography with various materials can be realized with any liquid solution and sample, such as nanoparticles, PDMS, nanowires by monitoring the fluid phenomena on the substrate with the home-made OM. After forming of capillary condensation between apex of the pipette tip and the surface, the electric field is applied to extract out the inside liquid to the substrate and the nano-microscale objects are fabricated. The nanoscale patterning size can be controlled by the aperture diameters of the pulled pipette.",

keywords = "Liquid delivery, Nano-Patterning, Nanopipette/QTF-AFM, PDMS",

author = "S. An and C. Stambaugh and S. Kwon and K. Lee and B. Kim and Q. Kim and W. Jhe",

year = "2013",

language = "English",

isbn = "9781482205848",

series = "Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013",

pages = "477--480",

booktitle = "Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013",

note = "Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 ; Conference date: 12-05-2013 Through 16-05-2013",

}

An, S, Stambaugh, C, Kwon, S, Lee, K, Kim, B, Kim, Q & Jhe, W 2013, Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system. in Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013, vol. 2, pp. 477-480, Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013, Washington, DC, United States, 13.05.12.

Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system. / An, S.; Stambaugh, C.; Kwon, S. et al.
Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. 2013. p. 477-480 (Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013; Vol. 2).

Research output: Contribution to conference › Conference paper › peer-review

TY - GEN

T1 - Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system

AU - An, S.

AU - Stambaugh, C.

AU - Kwon, S.

AU - Lee, K.

AU - Kim, B.

AU - Kim, Q.

AU - Jhe, W.

PY - 2013

Y1 - 2013

N2 - We demonstrated direct observation of nanofabrication using the optical microscope (OM) combined with nanopipette/QTF-AFM (Quartz Tuning Fork-Atomic Force Microscopy) system. Various solutions are ejected onto the substrate through the nano-/micro-aperture of the pulled pipette, and the nano-/microscale objects were formed in on-demand spot of the surface with the patterning system. Lithography with various materials can be realized with any liquid solution and sample, such as nanoparticles, PDMS, nanowires by monitoring the fluid phenomena on the substrate with the home-made OM. After forming of capillary condensation between apex of the pipette tip and the surface, the electric field is applied to extract out the inside liquid to the substrate and the nano-microscale objects are fabricated. The nanoscale patterning size can be controlled by the aperture diameters of the pulled pipette.

AB - We demonstrated direct observation of nanofabrication using the optical microscope (OM) combined with nanopipette/QTF-AFM (Quartz Tuning Fork-Atomic Force Microscopy) system. Various solutions are ejected onto the substrate through the nano-/micro-aperture of the pulled pipette, and the nano-/microscale objects were formed in on-demand spot of the surface with the patterning system. Lithography with various materials can be realized with any liquid solution and sample, such as nanoparticles, PDMS, nanowires by monitoring the fluid phenomena on the substrate with the home-made OM. After forming of capillary condensation between apex of the pipette tip and the surface, the electric field is applied to extract out the inside liquid to the substrate and the nano-microscale objects are fabricated. The nanoscale patterning size can be controlled by the aperture diameters of the pulled pipette.

KW - Liquid delivery

KW - Nano-Patterning

KW - Nanopipette/QTF-AFM

KW - PDMS

UR - https://www.scopus.com/pages/publications/84881093138

M3 - Conference paper

AN - SCOPUS:84881093138

SN - 9781482205848

T3 - Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013

SP - 477

EP - 480

BT - Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013

T2 - Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013

Y2 - 12 May 2013 through 16 May 2013

ER -

An S, Stambaugh C, Kwon S, Lee K, Kim B, Kim Q et al. Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system. In Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. 2013. p. 477-480. (Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013).

Direct observation of nanofabrication using the optical microscope combined with nanopipette/QTF-AFM system

Abstract

Publication series

Conference

UN SDGs

Keywords

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