Abstract
The fringe-field switching (FFS) mode associated with a transition from a homogenously aligned to twist deformation require rubbing process. In this devices, 1° of misalignment in an azimuthal direction could cause voltage-dependent transmittance (V-T) to be different from that in a normal area and consequently results in a rubbing mura. According to our studies, the single domain FFS cells are much more sensitive to the rubbing mura than the dual domain FFS cell. Moreover, the FFS cells with negative LC are much more sensitive to the rubbing mura than the FFS cells with positive LC.
| Original language | English |
|---|---|
| Pages (from-to) | 426-429 |
| Number of pages | 4 |
| Journal | Proceedings of International Meeting on Information Display |
| Volume | 1 |
| State | Published - 2006 |
| Event | 5th International Meeting on Information Display - Seoul, Korea, Republic of Duration: 2005.07.19 → 2005.07.23 |
Quacquarelli Symonds(QS) Subject Topics
- Engineering & Technology
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