Dual-Sensor-Based Active Protector for Nuclear EMP and Prompt Gamma-Ray Detection

Electromagnetic pulses (EMPs) generated by nuclear explosions can induce latch-up and burnout in semiconductor circuits through mechanisms similar to those caused by prompt gamma rays. Conventional nuclear event detectors (NEDs) mitigate radiation-induced latch-up by temporarily cutting power; however, they cannot respond to nanosecond-scale EMP transients. This article presents a dual-sensor-based active protector (DAP) that extends the NED concept by adding an EMP detection channel while maintaining the same transient power-cutoff mechanism. The integrated DAP consists of an EMP sensor, a prompt gamma-ray sensor, and a shared high-speed signal-processing circuit that evaluates both sensor outputs in real time and generates a cutoff-control pulse when the predefined threshold is exceeded. The gamma-ray channel was verified to exhibit a dose-rate response consistent with that of the original NED design. In EMP detection experiments, the DAP generated stable cutoff-control signals within approximately 50 ns. System-level tests demonstrated that the DAP effectively protected an integrated circuit from EMP-induced malfunction by temporarily interrupting the power supply.