Abstract
A dual-grating sensor head, which was designed for temperature-insensitive strain measurement, was used to measure fast-varying strain perturbations. Using a Mach-Zehnder interferometer technique, we obtained ∼0.1-με (microstrain) rms resolution with a 200-Hz strain input. The feasibility of measuring a dynamic-strain with a static-strain measuring configuration was also demonstrated.
| Original language | English |
|---|---|
| Pages (from-to) | 3484-3486 |
| Number of pages | 3 |
| Journal | Applied Optics |
| Volume | 37 |
| Issue number | 16 |
| DOIs | |
| State | Published - 1998.06.1 |
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