Abstract
The effect of moisture on the current of an AlGaN/GaN high-electron- mobility transistor was investigated. When the gate voltage was swept from -5 to 0 V at a drain voltage of 7 V, the current decreased with the sweep frequency from 38mA at 0.1 Hz to 15mA at 100 kHz. However, the decrease was mitigated to 29mA by moisturizing the ambient, and a marked current decrease in a pulsed operation was alleviated by moisture from 7.4 to 33mA at 100 kHz with a 10% duty cycle. The binding of polarized H2O to negatively charged traps was proposed as the reason for the alleviation of the current degradation.
| Original language | English |
|---|---|
| Article number | 096501 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 50 |
| Issue number | 9 PART 1 |
| DOIs | |
| State | Published - 2011.09 |
Quacquarelli Symonds(QS) Subject Topics
- Physics & Astronomy
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