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Effect of UV-assisted low-temperature annealing on electrical performance of Zn-Sn-O nanofiber-based field effect transistors

  • Minseo Kang
  • , Tan Tan Bui*
  • , Ji Hoon Lee*
  • *Corresponding author for this work
  • Jeonbuk National University
  • Hochiminh City University of Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

Low-temperature fabrication process of thin film transistors is essential for the flexible electronics using plastic substrates. We demonstrated the Zn-Sn-O (ZTO) nanofiber-based field effect transistors (FETs) which were fabricated at low temperature where the plastic substrates can be sustained. The nanofibers (NFs) were prepared by an electrospinning method incorporated with low-temperature decomposable nitrocellulose polymer and ultra-violet (UV) exposure. UV irradiation was applied under varying conditions, and all treated devices exhibited better electrical characteristics than their unirradiated counterparts. The synergetic effect of thermal annealing and photon energy from UV irradiation demonstrated improved adhesion between adjacent nanofibers and the nanofiber/dielectric interface, enhancing the electrical performance of NF-based FETs. The pre-exposure FET (Pre-F) showed the optimal electrical performance with an on/off current ratio exceeding 106, a low threshold voltage of −0.1 V, decent saturation mobility, and density of interface traps of 6.3 × 1012 cm−2. This low-temperature-fabricated ZTO NF-FET can be compatible with flexible polymer substrates, providing a platform for future applications in flexible electronics.

Original languageEnglish
Article number109909
JournalMaterials Science in Semiconductor Processing
Volume200
DOIs
StatePublished - 2025.12

Keywords

  • Electrospinning
  • Field effect transistor
  • Low-temperature process
  • Nanofibers
  • Ultraviolet
  • ZnSnO

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