Effects of cooling rate and post-heat treatment on properties of ZnO thin films deposited by sol-gel method

Min Su Kim; Kwang Gug Yim; Dong Yul Lee; Jin Soo Kim; Jong Su Kim; Jeong Sik Son; Jae Young Leem

doi:10.1016/j.apsusc.2011.05.092

Effects of cooling rate and post-heat treatment on properties of ZnO thin films deposited by sol-gel method

Min Su Kim
, Kwang Gug Yim
, Dong Yul Lee
, Jin Soo Kim
, Jong Su Kim
, Jeong Sik Son
, Jae Young Leem^*

^*Corresponding author for this work

Information Materials Engineering

Inje University
Samsung
Yeungnam University
Kyungwoon University

Research output: Contribution to journal › Journal article › peer-review

29 Scopus citations

Abstract

Sol-gel spin-coated ZnO thin films are cooled with different rates after the pre-heat treatment. Atomic force microscopy (AFM), X-ray diffraction (XRD), Raman, and photoluminescence (PL) were carried out to investigate the effects of the cooling rate during pre-heat treatment on structural and optical properties of the ZnO thin films. The ZnO thin films cooled slowly exhibit mountain chain structure while the ones cooled rapidly have smooth surface. The ZnO thin films cooled rapidly have higher c-axis orientation compared to the ones cooled slowly. The narrower and the higher near-band-edge emission (NBE) peaks are observed in the ZnO thin films cooled rapidly.

Original language	English
Pages (from-to)	9019-9023
Number of pages	5
Journal	Applied Surface Science
Volume	257
Issue number	21
DOIs	https://doi.org/10.1016/j.apsusc.2011.05.092
State	Published - 2011.08.15

Keywords

Atomic force microscopy
Photoluminescence
Raman
Sol-gel method
X-ray diffraction
Zinc oxide

Quacquarelli Symonds(QS) Subject Topics

Materials Science
Physics & Astronomy

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10.1016/j.apsusc.2011.05.092

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title = "Effects of cooling rate and post-heat treatment on properties of ZnO thin films deposited by sol-gel method",

abstract = "Sol-gel spin-coated ZnO thin films are cooled with different rates after the pre-heat treatment. Atomic force microscopy (AFM), X-ray diffraction (XRD), Raman, and photoluminescence (PL) were carried out to investigate the effects of the cooling rate during pre-heat treatment on structural and optical properties of the ZnO thin films. The ZnO thin films cooled slowly exhibit mountain chain structure while the ones cooled rapidly have smooth surface. The ZnO thin films cooled rapidly have higher c-axis orientation compared to the ones cooled slowly. The narrower and the higher near-band-edge emission (NBE) peaks are observed in the ZnO thin films cooled rapidly.",

keywords = "Atomic force microscopy, Photoluminescence, Raman, Sol-gel method, X-ray diffraction, Zinc oxide",

author = "Kim, \{Min Su\} and Yim, \{Kwang Gug\} and Lee, \{Dong Yul\} and Kim, \{Jin Soo\} and Kim, \{Jong Su\} and Son, \{Jeong Sik\} and Leem, \{Jae Young\}",

year = "2011",

month = aug,

day = "15",

doi = "10.1016/j.apsusc.2011.05.092",

language = "English",

volume = "257",

pages = "9019--9023",

journal = "Applied Surface Science",

issn = "0169-4332",

number = "21",

}

TY - JOUR

T1 - Effects of cooling rate and post-heat treatment on properties of ZnO thin films deposited by sol-gel method

AU - Kim, Min Su

AU - Yim, Kwang Gug

AU - Lee, Dong Yul

AU - Kim, Jin Soo

AU - Kim, Jong Su

AU - Son, Jeong Sik

AU - Leem, Jae Young

PY - 2011/8/15

Y1 - 2011/8/15

N2 - Sol-gel spin-coated ZnO thin films are cooled with different rates after the pre-heat treatment. Atomic force microscopy (AFM), X-ray diffraction (XRD), Raman, and photoluminescence (PL) were carried out to investigate the effects of the cooling rate during pre-heat treatment on structural and optical properties of the ZnO thin films. The ZnO thin films cooled slowly exhibit mountain chain structure while the ones cooled rapidly have smooth surface. The ZnO thin films cooled rapidly have higher c-axis orientation compared to the ones cooled slowly. The narrower and the higher near-band-edge emission (NBE) peaks are observed in the ZnO thin films cooled rapidly.

AB - Sol-gel spin-coated ZnO thin films are cooled with different rates after the pre-heat treatment. Atomic force microscopy (AFM), X-ray diffraction (XRD), Raman, and photoluminescence (PL) were carried out to investigate the effects of the cooling rate during pre-heat treatment on structural and optical properties of the ZnO thin films. The ZnO thin films cooled slowly exhibit mountain chain structure while the ones cooled rapidly have smooth surface. The ZnO thin films cooled rapidly have higher c-axis orientation compared to the ones cooled slowly. The narrower and the higher near-band-edge emission (NBE) peaks are observed in the ZnO thin films cooled rapidly.

KW - Atomic force microscopy

KW - Photoluminescence

KW - Raman

KW - Sol-gel method

KW - X-ray diffraction

KW - Zinc oxide

UR - https://www.scopus.com/pages/publications/79960161479

U2 - 10.1016/j.apsusc.2011.05.092

DO - 10.1016/j.apsusc.2011.05.092

M3 - Journal article

AN - SCOPUS:79960161479

SN - 0169-4332

VL - 257

SP - 9019

EP - 9023

JO - Applied Surface Science

JF - Applied Surface Science

IS - 21

ER -

Effects of cooling rate and post-heat treatment on properties of ZnO thin films deposited by sol-gel method

Abstract

Keywords

Quacquarelli Symonds(QS) Subject Topics

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