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Electrical characteristics of Pt Schottky contacts on AlInN:Mg/GaN heterostructures

  • Seongjun Kim
  • , Hee Jin Kim
  • , Suk Choi
  • , Jae Hyun Ryou
  • , Russell D. Dupuis
  • , Kwang Soon Ahn
  • , Hyunsoo Kim
  • Jeonbuk National University
  • Georgia Institute of Technology
  • University of Houston
  • Yeungnam University

Research output: Contribution to journal › Journal article › peer-review

Abstract

The electrical characteristics of Pt Schottky contacts on AlInN:Mg/GaN heterostructures were investigated. A barrier inhomogeneity model applied to temperature-dependent forward current-voltage (I-V) curves revealed the mean barrier height of 1.67 eV and the standard deviation of 0.22 eV. The reverse leakage current could be understood in terms of the Poole-Frenkel emission model, yielding the emission barrier height of 0.26 eV and the high-frequency relative dielectric permittivity of 5.32. On the basis of these obtained values, the continuum of electronic states could be predicted to locate 1.41 eV below the valence band.

Original languageEnglish
Article number10MA05
JournalJapanese Journal of Applied Physics
Volume52
Issue number10 PART2
DOIs
StatePublished - 2013

Quacquarelli Symonds(QS) Subject Topics

  • Physics & Astronomy

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