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Electrical properties of ZnO nanowire field effect transistors by surface passivation

  • Woong Ki Hong
  • , Bong Joong Kim
  • , Tae Wook Kim
  • , Gunho Jo
  • , Sunghoon Song
  • , Soon Shin Kwon
  • , Ahnsook Yoon
  • , Eric A. Stach
  • , Takhee Lee*
  • *Corresponding author for this work
  • Gwangju Institute of Science and Technology
  • Purdue University

Research output: Contribution to journalJournal articlepeer-review

Abstract

We have synthesized single crystalline ZnO nanowires by thermal evaporation method and fabricated individual ZnO nanowire field effect transistors (FETs) to investigate their electrical properties. ZnO nanowires are strongly affected by O2 molecules in ambient. For example, surface defects such as oxygen vacancies act as adsorption sites of O2 molecules, and the chemisorption of O2 molecules depletes the surface electron states and reduces the channel conductivity. Therefore, it is important to protect the electrical properties of ZnO nanowires by surface passivation. For this purpose, we investigated the changes of the electrical properties of ZnO nanowire FETs with and without passivation by an organic material, poly(methyl metahacrylate) (PMMA). The ZnO nanowire FETs with PMMA passivation exhibited better performance in comparison with unpassivated devices.

Original languageEnglish
Pages (from-to)378-382
Number of pages5
JournalColloids and Surfaces A: Physicochemical and Engineering Aspects
Volume313-314
DOIs
StatePublished - 2008.02.1

Keywords

  • Field effect transistor
  • Nanoelectronics
  • Nanowire
  • Passivation
  • ZnO

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