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Electronic structure evolution of single bilayer Bi(1 1 1) film on 3D topological insulator Bi2SexTe3-x surfaces

  • Tao Lei
  • , Kyung Hwan Jin
  • , Nian Zhang
  • , Jia Li Zhao
  • , Chen Liu
  • , Wen Jie Li
  • , Jia Ou Wang
  • , Rui Wu
  • , Hai Jie Qian
  • , Feng Liu*
  • , Kurash Ibrahim
  • *Corresponding author for this work
  • CAS - Institute of High Energy Physics
  • University of Utah
  • Zhejiang University
  • Matter

Research output: Contribution to journalJournal articlepeer-review

Abstract

The electronic state evolution of single bilayer (1BL) Bi(1 1 1) deposited on three-dimensional (3D) Bi2SexTe3-x topological insulators at x = 0, 1.26, 2, 2.46, 3 is systematically investigated by angle-resolved photoemission spectroscopy (ARPES). Our results indicate that the electronic structures of epitaxial Bi films are strongly influenced by the substrate especially the topmost sublayer near the Bi films, manifesting in two main aspects. First, the Se atoms cause a stronger charge transfer effect, which induces a giant Rashba-spin splitting, while the low electronegativity of Te atoms induces a strong hybridization at the interface. Second, the lattice strain notably modifies the band dispersion of the surface bands. Furthermore, our experimental results are elucidated by first-principles band structure calculations.

Original languageEnglish
Article number255501
JournalJournal of Physics Condensed Matter
Volume28
Issue number25
DOIs
StatePublished - 2016.05.10

Keywords

  • ARPES
  • Bi(1 1 1) film
  • electronic structure
  • interfacial interaction
  • topological insulator

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