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Enhanced heat dissipation using flip-chip geometry in InGaN laser diodes

  • Suhee Chae*
  • , Jaehee Cho
  • , Joon Seop Kwak
  • , Kyoungho Ha
  • , O. H. Nam
  • *Corresponding author for this work
  • Samsung

Research output: Contribution to journalConference articlepeer-review

Abstract

InGaN high power laser diodes (LDs) with flip-chip geometry were investigated, which was a useful method to achieve an efficient dissipation of the generated heat. We found that the height difference between electrodes in a submount had to be controlled precisely and the surface roughness of the submount had to be reduced. In the thermal response measurement, we found that the ambient gas during soldering was another factor to affect a bonding interface. The flip-chip geometry allows us to manufacture efficient, reliable InGaN LDs having high power of 50 mW at cw operation condition.

Original languageEnglish
Pages (from-to)S492-S494
JournalJournal of the Korean Physical Society
Volume42
Issue numberSPEC.
StatePublished - 2003.02
EventProceedings of The 11th Seoul International Symposium on the Physics of Semiconductors and Apllications - 2002 - Cheju Island, Korea, Republic of
Duration: 2002.08.202002.08.23

Keywords

  • Flip-chip
  • Heat transfer
  • InGaN
  • Laser diodes

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