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Enhanced performance of Si nanocrystal LEDs by using NiAg /indium tin oxide contact

  • Chul Huh*
  • , Jae Heon Shin
  • , Kyung Hyun Kim
  • , Chel Jong Choi
  • , Kwan Sik Cho
  • , Jongcheol Hong
  • , Gun Yong Sung
  • *Corresponding author for this work
  • Electronics and Telecommunications Research Institute

Research output: Contribution to journalJournal articlepeer-review

Abstract

We have investigated the NiAg /indium tin oxide (ITO) contacts to n-SiC films for silicon-nanocrystal (nc-Si) light-emitting diodes (LEDs). The electrical properties of the nc-Si LED with a thin NiAg interlayer was improved compared to that of the nc-Si LED without one. This was attributed to a decrease in the contact resistance due to the interfacial reaction at the contact region, which was confirmed by Auger depth profiles and high-resolution transmission electron microscope analyses. In addition, the light output power at a current of 20 mA was also enhanced by around 35%. This result strongly indicates that the NiAgITO contact can serve as a highly promising contact scheme to enhance the efficiency of the nc-Si LEDs.

Original languageEnglish
Article number001701ESL
Pages (from-to)J9-J11
JournalElectrochemical and Solid-State Letters
Volume10
Issue number1
DOIs
StatePublished - 2007

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