Abstract
We have investigated the NiAg /indium tin oxide (ITO) contacts to n-SiC films for silicon-nanocrystal (nc-Si) light-emitting diodes (LEDs). The electrical properties of the nc-Si LED with a thin NiAg interlayer was improved compared to that of the nc-Si LED without one. This was attributed to a decrease in the contact resistance due to the interfacial reaction at the contact region, which was confirmed by Auger depth profiles and high-resolution transmission electron microscope analyses. In addition, the light output power at a current of 20 mA was also enhanced by around 35%. This result strongly indicates that the NiAgITO contact can serve as a highly promising contact scheme to enhance the efficiency of the nc-Si LEDs.
| Original language | English |
|---|---|
| Article number | 001701ESL |
| Pages (from-to) | J9-J11 |
| Journal | Electrochemical and Solid-State Letters |
| Volume | 10 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2007 |
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