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Enhancement of Ferroelectric Properties of Superlattice-Based Epitaxial BiFeO3 Thin Films via Substitutional Doping Effect

  • Jaesun Song
  • , Kyoung Soon Choi
  • , Sejun Yoon
  • , Woonbae Sohn
  • , Seung Pyo Hong
  • , Tae Hyung Lee
  • , Hyunji An
  • , Sam Yeon Cho
  • , So Young Kim
  • , Do Hyun Kim
  • , Taemin Ludvic Kim
  • , Sang Yun Jeong
  • , Chung Wung Bark
  • , Byoung Hun Lee
  • , Sang Don Bu
  • , Ho Won Jang
  • , Cheolho Jeon
  • , Sanghan Lee*
  • *Corresponding author for this work
  • Gwangju Institute of Science and Technology
  • Korea Basic Science Institute
  • Seoul National University
  • Jeonbuk National University
  • Gachon University

Research output: Contribution to journalJournal articlepeer-review

Abstract

Although there is considerable interest in BiFeO3 owing to its versatile physical properties, which make it suitable for a wide range of applications, its high leakage current is a significant limitation. Among various methods for reducing the leakage current, substitution with transition-metal or rare-earth elements is widely recognized as the most effective approach. Herein, to enable in-depth studies of the physical properties of BiFeO3, high-quality epitaxial BiFeO3 thin films with a low leakage current must be formed. However, owing to the difficulty of controlling the element doping when pulsed laser deposition is used for epitaxial thin-film growth, studies on substitutional doping based on epitaxial BiFeO3 thin films have not been systematically carried out. In this regard, we establish an innovative approach for overcoming the high leakage current of BiFeO3 by fabricating artificially engineered superlattice-based epitaxial BiFeO3 thin films in which there is a significant reduction of the leakage current. The control of the element doping in epitaxial BiFeO3 thin films is easily regulated precisely at the atomic-scale level. The results of this study strongly suggest that superlattice-based epitaxial BiFeO3 thin films can be a cornerstone for exploring the reliable fundamental physical properties of substitutional doping in epitaxial BiFeO3 thin films.

Original languageEnglish
Pages (from-to)11564-11571
Number of pages8
JournalJournal of Physical Chemistry C
Volume123
Issue number18
DOIs
StatePublished - 2019.05.9

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Engineering - Electrical & Electronic
  • Engineering - Petroleum
  • Chemistry

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