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Erratum: "Double-layer" method to improve image quality of industria SPECT (Journal of Instrumentation (2011) 6 (C12032))

  • J. G. Park
  • , H. Seo
  • , C. H. Kim*
  • , S. H. Jung
  • , J. B. Kim
  • , J. Moon
  • , Y. S. Kim
  • *Corresponding author for this work
  • Hanyang University
  • Korea Atomic Energy Research Institute

Research output: Contribution to journalComment/debate

Original languageEnglish
Article numberE01001
JournalJournal of Instrumentation
Volume7
Issue number1
DOIs
StatePublished - 2012.01

Keywords

  • Detection of defects
  • Inspection with gamma rays

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