Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function

Chan Hoon Park; Myung Dong Ko; Ki Hyun Kim; Jae Ho Hong; Rock Hyun Baek; Jun Sik Yoon; Jeong Soo Lee; Yoon Ha Jeong

doi:10.1109/DRC.2013.6633875

Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function

Chan Hoon Park
, Myung Dong Ko
, Ki Hyun Kim
, Jae Ho Hong
, Rock Hyun Baek
, Jun Sik Yoon
, Jeong Soo Lee
, Yoon Ha Jeong

Division of Electronic Engineering

POSTECH
SEMATECH
Pohang University of Science and Technology

Research output: Contribution to conference › Conference paper › peer-review

3 Scopus citations

Original language	English
Title of host publication	71st Device Research Conference, DRC 2013 - Conference Digest
Pages	225-226
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2013.6633875
State	Published - 2013
Event	71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States Duration: 2013.06.23 → 2013.06.26

Publication series

Name	Device Research Conference - Conference Digest, DRC
ISSN (Print)	1548-3770

Conference

Conference	71st Device Research Conference, DRC 2013
Country/Territory	United States
City	Notre Dame, IN
Period	13.06.23 → 13.06.26

Access to Document

10.1109/DRC.2013.6633875

Cite this

Park, C. H., Ko, M. D., Kim, K. H., Hong, J. H., Baek, R. H., Yoon, J. S., Lee, J. S., & Jeong, Y. H. (2013). Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function. In 71st Device Research Conference, DRC 2013 - Conference Digest (pp. 225-226). Article 6633875 (Device Research Conference - Conference Digest, DRC). https://doi.org/10.1109/DRC.2013.6633875

@inproceedings{678fddf3085c410c851e34c0a929180a,

title = "Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function",

author = "Park, \{Chan Hoon\} and Ko, \{Myung Dong\} and Kim, \{Ki Hyun\} and Hong, \{Jae Ho\} and Baek, \{Rock Hyun\} and Yoon, \{Jun Sik\} and Lee, \{Jeong Soo\} and Jeong, \{Yoon Ha\}",

year = "2013",

doi = "10.1109/DRC.2013.6633875",

language = "English",

isbn = "9781479908110",

series = "Device Research Conference - Conference Digest, DRC",

pages = "225--226",

booktitle = "71st Device Research Conference, DRC 2013 - Conference Digest",

note = "71st Device Research Conference, DRC 2013 ; Conference date: 23-06-2013 Through 26-06-2013",

}

Park, CH, Ko, MD, Kim, KH, Hong, JH, Baek, RH, Yoon, JS, Lee, JS & Jeong, YH 2013, Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function. in 71st Device Research Conference, DRC 2013 - Conference Digest., 6633875, Device Research Conference - Conference Digest, DRC, pp. 225-226, 71st Device Research Conference, DRC 2013, Notre Dame, IN, United States, 13.06.23. https://doi.org/10.1109/DRC.2013.6633875

Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function. / Park, Chan Hoon; Ko, Myung Dong; Kim, Ki Hyun et al.
71st Device Research Conference, DRC 2013 - Conference Digest. 2013. p. 225-226 6633875 (Device Research Conference - Conference Digest, DRC).

Research output: Contribution to conference › Conference paper › peer-review

TY - GEN

T1 - Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function

AU - Park, Chan Hoon

AU - Ko, Myung Dong

AU - Kim, Ki Hyun

AU - Hong, Jae Ho

AU - Baek, Rock Hyun

AU - Yoon, Jun Sik

AU - Lee, Jeong Soo

AU - Jeong, Yoon Ha

PY - 2013

Y1 - 2013

UR - https://www.scopus.com/pages/publications/84890099399

U2 - 10.1109/DRC.2013.6633875

DO - 10.1109/DRC.2013.6633875

M3 - Conference paper

AN - SCOPUS:84890099399

SN - 9781479908110

T3 - Device Research Conference - Conference Digest, DRC

SP - 225

EP - 226

BT - 71st Device Research Conference, DRC 2013 - Conference Digest

T2 - 71st Device Research Conference, DRC 2013

Y2 - 23 June 2013 through 26 June 2013

ER -

Extraction of series resistance on junctionless and inversion-mode nanowire FET through the method based on Y-function

Publication series

Conference

Access to Document

Other files and links

Cite this