Abstract
Thin layers of InGaN were grown by metalorganic chemical vapor deposition and characterized with atomic force microscopy and high-resolution transmission electron microscopy. InGaN deposited on GaN esxhibits a Stranski-Krastanov growth mode, including 2D wetting layer and 3D self-assembled quantum dots. Besides, we observed that the formed InGaN nano-scale dots have a trapezoidal shape with a {1-102} facet with respect to (0002) surface. Visible spectral range from UV to green was easily obtained by changing InGaN quantum well thickness up to 2.3 nm.
| Original language | English |
|---|---|
| Journal | MRS Internet Journal of Nitride Semiconductor Research |
| Volume | 5 |
| Issue number | SUPPL. 1 |
| DOIs | |
| State | Published - 2000 |
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
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