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Ferroelectric Diodes with Sub-ns and Sub-fJ Switching and Its Programmable Network for Logic-in-Memory Applications

  • Hagyoul Bae
  • , Taehwan Moon
  • , Seung Geol Nam
  • , Kwang Hee Lee
  • , Sangwook Kim
  • , Sangjun Hong
  • , Duk Hyun Choe
  • , Sanghyun Jo
  • , Yunseong Lee
  • , Jinseong Heo*
  • *Corresponding author for this work
  • Samsung
  • Seoul National University

Research output: Contribution to conferenceConference paperpeer-review

Abstract

In this work, we report hafnium zirconium oxide (HZO)/indium gallium zinc oxide (IGZO)-based programmable ferroelectric (FE) diode memory array with ultra-fast sub-ns switching speed, thus extremely low sub-fJ switching energy for future in-memory and neuromorphic computing applications for the first time. The fabricated devices have electroresistance ratio of 3×105 and show robust cyclic endurance up to 109. In particular, we demonstrated a nonvolatile logic-in-memory circuit to implement NOT gate and incremental conductance changes to mimic analog nature of synaptic weights.

Original languageEnglish
Title of host publication2021 Symposium on VLSI Technology, VLSI Technology 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784863487802
StatePublished - 2021
Event41st Symposium on VLSI Technology, VLSI Technology 2021 - Virtual, Online, Japan
Duration: 2021.06.132021.06.19

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
Volume2021-June
ISSN (Print)0743-1562

Conference

Conference41st Symposium on VLSI Technology, VLSI Technology 2021
Country/TerritoryJapan
CityVirtual, Online
Period21.06.1321.06.19

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