Abstract
We have investigated field electron emission properties of diamond-like-carbon films deposited by a laser ablation method. Emission properties of diamond like carbon films show a strong correlation with surface roughness of the films which varies as a function of laser power densities. The surface morphology turns out to be critically dependent on the threshold emission voltage of the films. Measurement of electrical resistivity shows that the density states near the Fermi level is strongly localized. The major carrier transport occurs not by the activation to the conduction band but by hopping between the localized defect states near the Fermi level. The existence of localized defect bands in the intrinsic gap can also make it possible to emit electrons with a relatively small activation energy.
| Original language | English |
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| Pages | 532-536 |
| Number of pages | 5 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 10th International Vacuum Microelectronics Conference, IVMC'97 - Kyongju, Korea Duration: 1997.08.17 → 1997.08.21 |
Conference
| Conference | Proceedings of the 1997 10th International Vacuum Microelectronics Conference, IVMC'97 |
|---|---|
| City | Kyongju, Korea |
| Period | 97.08.17 → 97.08.21 |
Quacquarelli Symonds(QS) Subject Topics
- Physics & Astronomy
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