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GaInN light-emitting diode with conductive omnidirectional reflector having a low-refractive-index indium-tin oxide layer

  • Jong Kyu Kim*
  • , Thomas Gessmann
  • , E. Fred Schubert
  • , J. Q. Xi
  • , Hong Luo
  • , Jaehee Cho
  • , Cheolsoo Sone
  • , Yongjo Park
  • *Corresponding author for this work
  • Rensselaer Polytechnic Institute
  • Samsung

Research output: Contribution to journalJournal articlepeer-review

Abstract

Enhancement of light extraction in a GaInN light-emitting diode (LED) employing a conductive omnidirectional reflector (ODR) consisting of GaN, an indium-tin oxide (ITO) nanorod low-refractive-index layer, and an Ag layer is presented. An array of ITO nanorods is deposited on p-type GaN by oblique-angle electron-beam deposition. The refractive index of the nanorod ITO layer is 1.34 at 461 nm, significantly lower than that of dense ITO layer, which is n=2.06. The GaInN LEDs with GaN/low-n ITO/Ag ODR show a lower forward voltage and a 31.6% higher light-extraction efficiency than LEDs with Ag reflector. This is attributed to enhanced reflectivity of the ODR that employs the low-n ITO layer.

Original languageEnglish
Article number013501
JournalApplied Physics Letters
Volume88
Issue number1
DOIs
StatePublished - 2006

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