| Original language | Korean |
|---|---|
| Journal | Electronic Materials Letters |
| State | Published - 2012.12.1 |
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Growth and Characterization of Si1-xGex QDs on Si/Si0.8Ge0.2 Layer
- Sukill Kang
- , Kyu-Hwan Shim
Research output: Contribution to journal › Journal article › peer-review