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Growth of InxGa1-xN quantum dots by nitridation of nano-alloyed droplet method using MOCVD

  • Heon Song
  • , Seon Ho Lee
  • , Eun Su Jang
  • , Dong Wook Kim
  • , R. Navamathavan
  • , Jin Soo Kim
  • , Cheul Ro Lee*
  • *Corresponding author for this work
  • Research Center for Advanced Materials Development (RCAMD)

Research output: Contribution to journalJournal articlepeer-review

Abstract

InxGa1-xN quantum dots (QDs) were grown on GaN/sapphire (0 0 0 1) substrates by employing nitridation of nano-alloyed droplet (NNAD) method using metal-organic chemical vapor deposition (MOCVD). In+Ga alloy droplets were initially formed by flowing the precursors TMIn and TMGa. Density of the In+Ga alloy droplets was increased with increasing precursors flow rate; however, the droplet size was scarcely changed in the range of about 100-200 nm. Two cases of InxGa1-xN QDs growth were investigated by varying the nitridation time and the growth temperature. It was observed that the InxGa1-xN QDs size can be easily changed by controlling the nitridation process at the temperature between 680 and 700 °C for the time of 5-30 min. Self-assembled InxGa1-xN QDs were successfully grown by employing NNAD method.

Original languageEnglish
Pages (from-to)4418-4422
Number of pages5
JournalJournal of Crystal Growth
Volume311
Issue number19
DOIs
StatePublished - 2009.09.15

Keywords

  • A3. Droplet epitaxy
  • A3. MOCVD
  • B1. GaN
  • B1. InGaN dots

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