Abstract
InxGa1-xN quantum dots (QDs) were grown on GaN/sapphire (0 0 0 1) substrates by employing nitridation of nano-alloyed droplet (NNAD) method using metal-organic chemical vapor deposition (MOCVD). In+Ga alloy droplets were initially formed by flowing the precursors TMIn and TMGa. Density of the In+Ga alloy droplets was increased with increasing precursors flow rate; however, the droplet size was scarcely changed in the range of about 100-200 nm. Two cases of InxGa1-xN QDs growth were investigated by varying the nitridation time and the growth temperature. It was observed that the InxGa1-xN QDs size can be easily changed by controlling the nitridation process at the temperature between 680 and 700 °C for the time of 5-30 min. Self-assembled InxGa1-xN QDs were successfully grown by employing NNAD method.
| Original language | English |
|---|---|
| Pages (from-to) | 4418-4422 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 311 |
| Issue number | 19 |
| DOIs | |
| State | Published - 2009.09.15 |
Keywords
- A3. Droplet epitaxy
- A3. MOCVD
- B1. GaN
- B1. InGaN dots
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