Abstract
Zinc oxide (ZnO) heteroepitaxial thin films were successfully grown on p-GaN/sapphire (0 0 0 1) by single-step hydrothermal route at a low temperature of 90 °C. Continuous ZnO thin films with c-axis orientation were grown in aqueous solution of zinc acetate di-hydrate and ammonium hydroxide. X-ray diffraction, scanning electron microscopy and room temperature photoluminescence were carried out for structural, morphological and optical property analysis. The as-grown ZnO films showed preferential growth along (0 0 0 1) direction. The in-plane orientation between ZnO thin film and p-GaN buffer layer was found to be [1 1 2̄ 0]ZnO∥[1 1 2̄ 0]GaN. Sharp luminescence peak centered at 377 nm due to excitonic recombination from ZnO thin film was observed.
| Original language | English |
|---|---|
| Pages (from-to) | 570-574 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 310 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2008.02.1 |
Keywords
- A1. Crystal structure
- A1. X-ray diffraction
- A2. Hydrothermal crystal growth
- A3. Thin film
- B1. Zinc compounds
- B2. Semiconducting II-VI materials
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Chemistry
- Physics & Astronomy
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