Abstract
Epitaxial ZnO thin film was grown on spinel (111) substrates by using a hydrothermal technique. The phase and the surface morphology of the ZnO thin films were studied by using X-ray diffraction and field emission scanning electron microscopy. The as-grown film was c-axis oriented and had a rough pitted surface morphology. The thickness of the film was found to depend greatly on the initial precursor concentration. Room-temperature photoluminescence measurements were carried out to study the optical properties of the as-grown epitaxial ZnO thin films. Band edge luminescence due to excitonic recombination and deep-level emission peaks were observed.
| Original language | English |
|---|---|
| Pages (from-to) | 313-316 |
| Number of pages | 4 |
| Journal | Journal of the Korean Physical Society |
| Volume | 53 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2008.07 |
Keywords
- Epitaxial
- Hydrothermal
- Photoluminescence
- Single crystal
- X-ray diffraction
- ZnO
Quacquarelli Symonds(QS) Subject Topics
- Physics & Astronomy
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