Identification of ZnTiO3 nanostructures in oxidized TiN/ZnS thin films using X-ray absorption spectroscopy

  • Minji Lee
  • , Ahmed Y. Mohamed
  • , Doyeong Kim
  • , Dae Hyun Kim
  • , Tae Joo Park
  • , Deok Yong Cho*
  • *Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

Abstract

We examined the chemical and local structural properties of oxidized TiN/ZnS and TiN/ZnO thin films using X-ray absorption spectroscopy (XAS). The composite films were oxidized by post-deposition annealing (PDA) under various oxygen partial pressures (P(O2)). The results of the X-ray absorption near-edge structure (XANES) analyses showed that the S and N vaporized, and a zinc titanate (ZnTiO3)-like phase formed when annealed under the oxygen ambiance. An ab initio XANES simulation as well as the extended X-ray absorption fine structure (EXAFS) analysis further resolved the local structures of ZnTiO3-like phase into high symmetry structures such as ilmenite-like or perovskite-like local structure; for instance, the local structure of TiN/ZnS films annealed with P(O2) = 2 Torr could be described as a mixture of 50% ilmenite ZnTiO3 + 30% perovskite ZnTiO3 + 20% wurtzite ZnO local structures. The formation of ZnTiO3-like local structure is also subject to the temperature during the PDA or the choice of bottom layers (ZnS or ZnO). The temperature of the TiN/ZnS-to-ZnTiO3 local structural phase transformation, was estimated to be 500–600 °C at P(O2) = 2 Torr, and ZnO as bottom layer apparently expedited such local structural evolution by supplying oxygen to TiN.

Original languageEnglish
Pages (from-to)63-71
Number of pages9
JournalApplied Surface Science
Volume494
DOIs
StatePublished - 2019.11.15

Keywords

  • Post deposition annealing
  • TiN
  • Titanate
  • X-ray absorption spectroscopy
  • ZnS
  • ZnTiO

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Chemistry
  • Physics & Astronomy

Fingerprint

Dive into the research topics of 'Identification of ZnTiO3 nanostructures in oxidized TiN/ZnS thin films using X-ray absorption spectroscopy'. Together they form a unique fingerprint.

Cite this