Abstract
InGaN/GaN multiple-quantum-well light-emitting diodes (LEDs) with p-AlGaN electron blocking layers (EBLs) were grown by using metal-organic chemical vapor deposition. The effects of the EBL thickness on the electrical properties and the luminescent efficiency of the LEDs were investigated by using capacitance-voltage (C-V) measurements, current-voltage (I - V) measurements, electroluminescence (EL), and time-resolved photoluminescence (TR-PL). The EL efficiency of the LEDs increased with increasing thickness of the p-AlGaN EBL. In addition, the EL efficiency of the LEDs also increased with increasing injection current. The carrier lifetime of the LEDs increased with increasing thickness of the p-AlGaN EBL.
| Original language | English |
|---|---|
| Pages (from-to) | 1160-1163 |
| Number of pages | 4 |
| Journal | Journal of the Korean Physical Society |
| Volume | 62 |
| Issue number | 8 |
| DOIs | |
| State | Published - 2013.04 |
Keywords
- Electroluminescence
- Electron blocking layer
- Gallium nitride
- Light-emitting diode
- Timeresolved photoluminescence
Quacquarelli Symonds(QS) Subject Topics
- Physics & Astronomy
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