Skip to main navigation Skip to search Skip to main content

Improved energy storage performance in flexible (PbLa)ZrO3 thin films via nanocrystalline engineering

  • Chao Yin
  • , Tiandong Zhang*
  • , Changhai Zhang
  • , Chang Kyu Jeong
  • , Geon Tae Hwang
  • , Qingguo Chi*
  • *Corresponding author for this work
  • Harbin University of Science and Technology
  • Pukyong National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

Flexible film capacitors with high energy storage density (Wrec) and charge-discharge efficiency (η) are a cutting-edge research topic in the current field of energy storage. In this work, flexible all-inorganic (Pb0.91La0.06)ZrO3 ((PbLa)ZrO3) thin films are designed and integrated on mica substrates by a sol-gel method. By adjusting the rapid annealing temperature of (PbLa)ZrO3 thin films, the influence of the microstructure on the electrical properties and energy storage performances has been comprehensively investigated. The results show that the (PbLa)ZrO3 thin films annealed at 550 °C have a nanocrystalline structure, which is beneficial to reducing energy loss and improving insulation performance. A large Wrec of 42.0 J cm−3 and an outstanding η of 90.2% are achieved in (PbLa)ZrO3 films via nanocrystalline engineering. Moreover, the flexible capacitor films exhibit good temperature stability (25-140 °C), frequency stability (1-10 k Hz), bending stability (104 cycles) and electric fatigue stability (107 cycles). This work is expected to promote the application of (PbLa)ZrO3-based film capacitors in energy storage systems.

Original languageEnglish
Pages (from-to)17003-17011
Number of pages9
JournalJournal of Materials Chemistry C
Volume11
Issue number48
DOIs
StatePublished - 2023.11.21

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Chemistry

Fingerprint

Dive into the research topics of 'Improved energy storage performance in flexible (PbLa)ZrO3 thin films via nanocrystalline engineering'. Together they form a unique fingerprint.

Cite this